Atomic Force Microscopy in Process Engineering An Introduction to AFM for Improved Processes and Pro
- Author
- W. Richard Bowen, Nidal Hilal
- Publisher
- Butterworth-Heinemann
- Language
- English
- Year
- 2009
- Page
- 290
- ISBN
- 1856175170,9781856175173
- File Type
- pdf
- File Size
- 8.1 MiB
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