Extreme Statistics in Nanoscale Memory Design
- Author
- Amith Singhee (auth.), Amith Singhee, Rob A. Rutenbar (eds.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2010
- Page
- 246
- ISBN
- 1441966056,9781441966056
- File Type
- pdf
- File Size
- 4.1 MiB
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