Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
- Author
- Adam Foster, Werner Hofer,
- Publisher
- Springer
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 291
- ISBN
- 0387400907,9780387400907,9780387372310
- File Type
- pdf
- File Size
- 7.6 MiB
How to Download?!!!
Just click on START button on Telegram Bot