Reliability Wearout Mechanisms in Advanced CMOS Technologies (IEEE Press Series on Microelectronic Systems)
- Author
- Alvin W. Strong, Ernest Y. Wu, Rolf-Peter Vollertsen, Jordi Sune, Giuseppe La Rosa, Timothy D. Sullivan, Stewart E. Rauch III
- Publisher
- Wiley-IEEE Press
- Language
- English
- Edition
- 1
- Year
- 2009
- Page
- 643
- ISBN
- 0471731722,9780471731726
- File Type
- pdf
- File Size
- 5.4 MiB
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