Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy
- Author
- José A. Gutierrez, Brian S.R. Armstrong
- Publisher
- Springer
- Language
- English
- Edition
- 1st Edition.
- Year
- 2007
- Page
- 167
- ISBN
- 1846289122,9781846289125
- File Type
- pdf
- File Size
- 4.3 MiB
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