In-Situ Microscopy in Materials Research: Leading International Research in Electron and Scanning Probe Microscopies

Author
E. Bauer (auth.), Pratibha L. Gai (eds.)
Publisher
Springer US
Language
English
Edition
1
Year
1997
Page
336
ISBN
978-0-7923-9989-6,978-1-4615-6215-3
File Type
pdf
File Size
15.1 MiB

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