Applied logistic regression (Wiley Series in probability and statistics)
- Author
- David W. Hosmer, Stanley Lemeshow
- Publisher
- Wiley-Interscience Publication
- Language
- English
- Edition
- 2
- Year
- 2000
- Page
- 396
- ISBN
- 0471356328,9780471356325
- File Type
- pdf
- File Size
- 12.3 MiB
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