Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents (NanoScience and Technology)
- Author
- Adam Foster, Werner A. Hofer
- Publisher
- Springer
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 291
- ISBN
- 9780387400907,0387400907
- File Type
- pdf
- File Size
- 7.6 MiB
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