Design and Analysis of Accelerated Tests for Mission Critical Reliability
- Author
- Michael J. LuValle, Bruce G. LeFevre, SirRaman Kannan
- Publisher
- Chapman and Hall/CRC
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 248
- ISBN
- 9781584884712,1584884711
- File Type
- rar
- File Size
- 8.3 MiB
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