Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Built-in Fault-Tolerant Computing Paradigm for Resilient Large-Scale Chip Design: A Self-Test, Self-Diagnosis, and Self-Repair-Based Approach

Author
Xiaowei LiGuihai YanCheng Liu
Publisher
Springer Nature
Language
English
Year
2023
Page
318
ISBN
9789811985515,9789811985508,9811985510
File Type
epub
File Size
26.6 MiB

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