Computed Electron Micrographs and Defect Identification
- Author
- A.K. HEAD, P. HUMBLE, L.M. CLAREBROUGH, A.J. MORTON and C.T. FORWOOD (Eds.)
- Publisher
- Elsevier Science Publishing Co Inc.,U.S
- Language
- English
- Year
- 1973
- Page
- 1-400
- ISBN
- 978-0-7204-1757-9
- File Type
- pdf
- File Size
- 12.0 MiB
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