Defects in Microelectronic Materials and Devices
- Author
- Daniel M. Fleetwood, Ronald D. Schrimpf
- Publisher
- CRC Press
- Language
- English
- Edition
- 1
- Year
- 2008
- Page
- 770
- ISBN
- 9781420043761,1420043765
- File Type
- rar
- File Size
- 23.7 MiB
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