Analysis and Design of Resilient VLSI Circuits: Mitigating Soft Errors and Process Variations
- Author
- Rajesh Garg, Sunil P. Khatri (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2010
- Page
- 212
- ISBN
- 978-1-4419-0930-5,978-1-4419-0931-2
- File Type
- pdf
- File Size
- 4.1 MiB
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