Interfacial Compatibility in Microelectronics: Moving Away from the Trial and Error Approach
- Author
- Tomi Laurila, Vesa Vuorinen, Mervi Paulasto-Kröckel, Markus Turunen, Toni T. Mattila, Jorma Kivilahti (auth.)
- Publisher
- Springer-Verlag London
- Language
- English
- Edition
- 1
- Year
- 2012
- Page
- 218
- ISBN
- 1447124693,9781447124696
- File Type
- pdf
- File Size
- 5.6 MiB
How to Download?!!!
Just click on START button on Telegram Bot