CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
- Author
- Andrei Pavlov
- Publisher
- Springer
- Language
- English
- Year
- 2008
- Page
- 202
- ISBN
- 1402083629
- File Type
- pdf
- File Size
- 10.6 MiB
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