Statistical performance analysis and modeling techniques for nanometer VLSI designs
- Author
- Ruijing Shen, Sheldon X.-D. Tan, Hao Yu (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2012
- Page
- 306
- ISBN
- 9781461407881,1461407885
- File Type
- pdf
- File Size
- 6.8 MiB
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