Molecular modeling and multiscaling issues for electronic material applications
- Author
- V. Eyert, A. Mavromaras, D. Rigby, W. Wolf, M. Christensen, M. Halls, C. Freeman (auth.), Nancy Iwamoto, Matthew M.F. Yuen, Haibo Fan (eds.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2012
- Page
- 260
- ISBN
- 9781461417286,1461417287
- File Type
- pdf
- File Size
- 12.6 MiB
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