Pattern Recognition: 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings

Author: David Gallup, Marc Pollefeys, Jan-Michael Frahm (auth.), Michael Goesele, Stefan Roth, Arjan Kuijper, Bernt Schiele, Konrad Schindler (eds.)
Publisher: Springer-Verlag Berlin Heidelberg
Language: English
Edition: 1
Year: 2010
Page: 574
ISBN: 9783642159862,3642159869
File Type: pdf
File Size: 19.3 MiB

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