Photo-Excited Charge Collection Spectroscopy: Probing the traps in field-effect transistors
- Author
- Seongil Im, Youn-Gyoung Chang, Jae Hoon Kim
- Publisher
- Springer
- Language
- English
- Edition
- 2013
- Year
- 2013
- Page
- 112
- ISBN
- 9400763913,9789400763913
- File Type
- pdf
- File Size
- 5.6 MiB
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