On-Line Testing for VLSI

Author: M. Nicolaidis, Y. Zorian (auth.), Michael Nicolaidis, Yervan Zorian, Dhiraj K. Pradan (eds.)
Publisher: Springer US
Language: English
Edition: 1
Year: 1998
Page: 160
ISBN: 978-1-4419-5033-8,978-1-4757-6069-9
File Type: pdf
File Size: 7.7 MiB

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