Applied Logistic Regression, Second Edition
- Author
- David W. Hosmer, Stanley Lemeshow(auth.), Walter A. Shewhart, Samuel S. Wilks(eds.)
- Publisher
- John Wiley & Sons, Inc.
- Language
- English
- Year
- 2000
- Page
- 396
- ISBN
- 9780471356325,9780471722144
- File Type
- pdf
- File Size
- 3.4 MiB
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