Delay Fault Testing for VLSI Circuits
- Author
- Angela Krstić, Kwang-Ting Cheng (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1998
- Page
- 191
- ISBN
- 978-1-4613-7561-6,978-1-4615-5597-1
- File Type
- pdf
- File Size
- 8.3 MiB
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