Lock-in Thermography: Basics and Use for Functional Diagnostics of Electronic Components
- Author
- Dr. Otwin Breitenstein, Dr. Martin Langenkamp (auth.)
- Publisher
- Springer Berlin Heidelberg
- Language
- English
- Year
- 2003
- Page
- 197
- ISBN
- 978-3-642-07785-2,978-3-662-08396-3
- File Type
- pdf
- File Size
- 6.5 MiB
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