Risk Methodologies for Technological Legacies

Author: Dennis C. Bley, James G. Droppo, Vitaly A. Eremenko, Regina Lundgren (auth.), Dennis C. Bley, James G. Droppo, Vitaly A. Eremenko, Regina Lundgren (eds.)
Publisher: Springer Netherlands
Language: English
Edition: 1
Year: 2003
Page: 366
ISBN: 978-1-4020-1258-7,978-94-010-0097-0
File Type: pdf
File Size: 18.3 MiB

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