Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
- Author
- T. Hogg, G. Snider (auth.), Mohammad Tehranipoor (eds.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2008
- Page
- 408
- ISBN
- 978-0-387-74746-0,978-0-387-74747-7
- File Type
- pdf
- File Size
- 9.5 MiB
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