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Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability
Author
T. Hogg, G. Snider (auth.), Mohammad Tehranipoor (eds.)
Publisher
Springer US
Language
English
Edition
1
Year
2008
Page
408
ISBN
978-0-387-74746-0,978-0-387-74747-7
File Type
pdf
File Size
9.5 MiB
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