Reliability of Nanoscale Circuits and Systems: Methodologies and Circuit Architectures
- Author
- Miloš Stanisavljević, Alexandre Schmid, Yusuf Leblebici (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2011
- Page
- 195
- ISBN
- 978-1-4419-6216-4,978-1-4419-6217-1
- File Type
- pdf
- File Size
- 6.2 MiB
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