Volume Graphics 2001: Proceedings of the Joint IEEE TCVG and Eurographics Workshop in Stony Brook, New York, USA, June 21–22, 2001

Author
David Rodgman, Min Chen (auth.), Ass.-Prof. Klaus Mueller PhD, Prof. Arie E. Kaufman PhD (eds.)
Publisher
Springer-Verlag Wien
Language
English
Edition
1
Year
2001
Page
434
ISBN
978-3-211-83737-5,978-3-7091-6756-4
File Type
pdf
File Size
19.4 MiB

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