Charged Semiconductor Defects: Structure, Thermodynamics and Diffusion
- Author
- Edmund G. Seebauer, Meredith C. Kratzer (auth.)
- Publisher
- Springer-Verlag London
- Language
- English
- Edition
- 1
- Year
- 2009
- Page
- 298
- ISBN
- 978-1-84882-058-6,978-1-84882-059-3
- File Type
- pdf
- File Size
- 8.5 MiB
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