New Horizons of Applied Scanning Electron Microscopy
- Author
- Kenichi Shimizu, Tomoaki Mitani (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2010
- Page
- 182
- ISBN
- 978-3-642-03159-5,978-3-642-03160-1
- File Type
- pdf
- File Size
- 11.2 MiB
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