Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
- Author
- Nobuyasu Kanekawa, Eishi H. Ibe, Takashi Suga, Yutaka Uematsu (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2011
- Page
- 204
- ISBN
- 978-1-4419-6714-5,978-1-4419-6715-2
- File Type
- pdf
- File Size
- 12.8 MiB
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