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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author
Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel (auth.)
Publisher
Springer US
Language
English
Edition
1
Year
2010
Page
171
ISBN
978-1-4419-0937-4,978-1-4419-0938-1
File Type
pdf
File Size
4.3 MiB
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