Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
- Author
- Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2010
- Page
- 171
- ISBN
- 978-1-4419-0937-4,978-1-4419-0938-1
- File Type
- pdf
- File Size
- 4.3 MiB
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