Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy
- Author
- Brian S.R. Armstrong, José A. Gutierrez (auth.)
- Publisher
- Springer-Verlag London
- Language
- English
- Edition
- 1
- Year
- 2008
- Page
- 162
- ISBN
- 978-1-84628-912-5,978-1-84628-913-2
- File Type
- pdf
- File Size
- 5.9 MiB
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