Intrinsic Point Defects, Impurities, and Their Diffusion in Silicon
- Author
- Dr. techn. Peter Pichler (auth.)
- Publisher
- Springer-Verlag Wien
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 554
- ISBN
- 978-3-7091-7204-9,978-3-7091-0597-9
- File Type
- pdf
- File Size
- 14.5 MiB
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