Advanced Experimental Methods For Noise Research in Nanoscale Electronic Devices
- Author
- F.N. Hooge (auth.), Josef Sikula, Michael Levinshtein (eds.)
- Publisher
- Springer Netherlands
- Language
- English
- Edition
- 1
- Year
- 2005
- Page
- 368
- ISBN
- 978-1-4020-2169-5,978-1-4020-2170-1
- File Type
- pdf
- File Size
- 7.6 MiB
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