Impact of Electron and Scanning Probe Microscopy on Materials Research

Author
Gareth Thomas (auth.), David G. Rickerby, Giovanni Valdrè, Ugo Valdrè (eds.)
Publisher
Springer Netherlands
Language
English
Edition
1
Year
1999
Page
489
ISBN
978-0-7923-5940-1,978-94-011-4451-3
File Type
pdf
File Size
26.4 MiB

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