Advances in X-Ray Analysis: Volume 39

Author: J. L. de Vries (auth.), John V. Gilfrich, Ron Jenkins, Robert L. Snyder, Mary Ann Zaitz, I. Cev Noyan, Ting C. Huang, Deane K. Smith, Paul K. Predecki (eds.)
Publisher: Springer US
Language: English
Year: 1998
Page: 1998
ISBN: 978-0-306-45803-3,978-1-4615-5377-9
File Type: pdf
File Size: 47.6 MiB

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