Mustererkennung 2000: 22. DAGM-Symposium. Kiel, 13.–15. September 2000
- Author
- N. Navab, M. Appel, Y. Genc, B. Bascle, V. Kumar, M. Neuberger (auth.), Gerald Sommer, Norbert Krüger, Christian Perwass (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- German
- Edition
- 1
- Year
- 2000
- Page
- 490
- ISBN
- 978-3-540-67886-1,978-3-642-59802-9
- File Type
- pdf
- File Size
- 28.9 MiB
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