High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
- Author
- Ullrich Pietsch, Václav Holý, Tilo Baumbach (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 2
- Year
- 2004
- Page
- 408
- ISBN
- 978-1-4419-2307-3,978-1-4757-4050-9
- File Type
- pdf
- File Size
- 16.2 MiB
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