Physical Principles of Electron Microscopy: An Introduction to TEM, SEM, and AEM
- Author
- Ray F. Egerton (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2005
- Page
- 202
- ISBN
- 978-0-387-25800-3,978-0-387-26016-7
- File Type
- pdf
- File Size
- 7.2 MiB
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