Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces
- Author
- Weronika Walkosz (auth.)
- Publisher
- Springer-Verlag New York
- Language
- English
- Edition
- 1
- Year
- 2011
- Page
- 110
- ISBN
- 978-1-4419-7816-5,978-1-4419-7817-2
- File Type
- pdf
- File Size
- 3.9 MiB
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