Ferroelectric Random Access Memories: Fundamentals and Applications
- Author
- James F. Scott (auth.), Prof. Hiroshi Ishiwara, Prof. Masanori Okuyama, Dr. Yoshihiro Arimoto (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 291
- ISBN
- 978-3-540-40718-8,978-3-540-45163-1
- File Type
- pdf
- File Size
- 7.1 MiB
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