EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany: Volume 1: Instrumentation and Methods

Author
Martina Luysberg, Karsten Tillmann, Thomas Weirich (eds.)
Publisher
Springer
Language
English
Year
2008
Page
897
ISBN
978-3-540-85154-7,978-3-540-85156-1
File Type
pdf
File Size
122.7 MiB

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