Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
- Author
- Thorsten Joachims (auth.), Dit-Yan Yeung, James T. Kwok, Ana Fred, Fabio Roli, Dick de Ridder (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Language
- English
- Edition
- 1
- Year
- 2006
- Page
- 939
- ISBN
- 3540372369,9783540372363
- File Type
- pdf
- File Size
- 30.7 MiB
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