Testing and Diagnosis of VLSI and ULSI
- Author
- T. W. Williams (auth.), Fabrizio Lombardi, Mariagiovanna Sami (eds.)
- Publisher
- Springer Netherlands
- Language
- English
- Edition
- 1
- Year
- 1988
- Page
- 544
- ISBN
- 978-94-010-7134-5,978-94-009-1417-9
- File Type
- pdf
- File Size
- 15.4 MiB
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