Advances in X-Ray Analysis: Volume 35B
- Author
- Gerald R. Lachance (auth.), Charles S. Barrett, John V. Gilfrich, Ting C. Huang, Ron Jenkins, Gregory J. McCarthy, Paul K. Predecki, Richard Ryon, Deane K. Smith (eds.)
- Publisher
- Springer US
- Language
- English
- Year
- 1992
- Page
- IV, 640 p.
- ISBN
- 978-1-4613-6532-7,978-1-4615-3460-0
- File Type
- pdf
- File Size
- 38.3 MiB
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