Applied Rasch Measurement: A Book of Exemplars: Papers in Honour of John P. Keeves
- Author
- Sivakumar Alagumalai, David D. Curtis (auth.), Dr. Rupert Maclean, Ryo Watanabe, Robyn Baker, Dr. Boediono, Professor Yin Cheong Cheng, Dr. Wendy Duncan, Professor John Keeves, Dr. Zhou Mansheng, Professor Colin Power, Professor J. S. Rajput, Professor Konai Helu Thaman, Sivakumar Alagumalai, David D. Curtis, Njora Hungi (eds.)
- Publisher
- Springer Netherlands
- Language
- English
- Edition
- 1
- Year
- 2005
- Page
- 360
- ISBN
- 978-1-4020-3072-7,978-1-4020-3076-5
- File Type
- pdf
- File Size
- 5.2 MiB
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