IDDQ Testing of VLSI Circuits
- Author
- Jerry M. Soden, Charles F. Hawkins, Ravi K. Gulati (auth.), Ravi K. Gulati, Charles F. Hawkins (eds.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1993
- Page
- 124
- ISBN
- 978-1-4613-6377-4,978-1-4615-3146-3
- File Type
- pdf
- File Size
- 11.5 MiB
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