Testability Concepts for Digital ICs: The Macro Test Approach
- Author
- F. P. M. Beenker, R. G. Bennetts, A. P. Thijssen (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1995
- Page
- 212
- ISBN
- 978-1-4613-6004-9,978-1-4615-2365-9
- File Type
- pdf
- File Size
- 9.0 MiB
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