Testing Static Random Access Memories: Defects, Fault Models and Test Patterns
- Author
- Said Hamdioui (auth.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 2004
- Page
- 221
- ISBN
- 978-1-4419-5430-5,978-1-4757-6706-3
- File Type
- pdf
- File Size
- 6.3 MiB
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