Surface and Interface Characterization by Electron Optical Methods
- Author
- A. Howie (auth.), A. Howie, U. Valdrè (eds.)
- Publisher
- Springer US
- Language
- English
- Edition
- 1
- Year
- 1989
- Page
- 319
- ISBN
- 978-1-4615-9539-7,978-1-4615-9537-3
- File Type
- pdf
- File Size
- 8.5 MiB
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